Nanovea Profilometer is used to measure two different types of solar material (photovoltaic material and glass) and calculate their respective surface roughness,surface features and wafer bow. The shape of trace lines on the photovoltaic material will also be measured. With a maximum stage speed of 1 meter per second, the HS1000, unlike stylus profilometers, can easily handle high production throughput applications in quality control environments.
