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Thin Film Thickness Measurement With 3D Metrology

Author: NANOVEA Share [+]
Views:617
Domain:  Green Tech; Category: Photovoltaics/Solar; Subcategory: Thin Film
Paper Summary:  Thin film thickness control is highly important to the manufacturing process of various highly demanded applications. The ideal technique for assuring this control would be a highly accurate, non-contact, high speed measurement with no disturbance from transparent and or reflective surfaces.  
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NANOVEA | A Better Measure. (Senior)
Short URL: http://energy.wesrch.com/pdfTR1L02HEZAQHM
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